Quasi-phase-matched difference frequency generation (8-13 μm) in an isotropic semiconductor using total reflection

Applied Physics Letters

Volumn 82, Issue 8, 2003, Pages 1167-1169

  Haidar R ^a   Kupecek, Ph ^a,b   Rosencher, E ^a   Triboulet, R ^a,c   Lemasson, Ph ^a,c  

^a ONERA   (France)

^b SORBONNE UNIVERSITÉ   (France)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; LIGHT REFLECTION; OPTICAL PARAMETRIC OSCILLATORS; PHASE SHIFT;

QUASI PHASE MATCHING (QPM);

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0037463305     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1557326     Document Type: Article

References (11)

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