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Volumn 118, Issue 8, 2003, Pages 3731-3735
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Charge trapping in DNA due to intrinsic vibrational hot spots
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
ELECTRON TRAPS;
MOLECULAR DYNAMICS;
THERMAL EFFECTS;
CHARGE TRAPPING;
DNA;
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EID: 0037460522
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1539091 Document Type: Article |
Times cited : (72)
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References (27)
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