Determination of the nature of principal scattering mechanism in well-annealed vacuum deposited thin films of the ternary thermoelectric material Bi2(Te0.8Se0.2)3

Thin Solid Films

Volumn 424, Issue 1, 2003, Pages 75-78

  Das, V Damodara ^a   Mallik, Ramesh Chandra ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Lattice scattering; Parameter; Resistivity; Thermopower

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; THERMAL CONDUCTIVITY OF SOLIDS; THERMOELECTRICITY; X RAY DIFFRACTION ANALYSIS;

SCATTERING INDEX PARAMETERS;

THIN FILMS;

EID: 0037460394     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00919-7     Document Type: Conference Paper

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