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Volumn 113, Issue 2, 2003, Pages 335-344

Influence of temperature on expander stability and on the cycle life of negative plates

Author keywords

ECE 15 test; Expanders; NAM degradation; NAM structure; Negative plate

Indexed keywords

CRYSTALS; DEGRADATION; LEAD; OXIDATION; POROUS MATERIALS; THERMAL EFFECTS;

EID: 0037457919     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-7753(02)00546-3     Document Type: Conference Paper
Times cited : (18)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.