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Volumn 113, Issue 2, 2003, Pages 335-344
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Influence of temperature on expander stability and on the cycle life of negative plates
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Author keywords
ECE 15 test; Expanders; NAM degradation; NAM structure; Negative plate
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Indexed keywords
CRYSTALS;
DEGRADATION;
LEAD;
OXIDATION;
POROUS MATERIALS;
THERMAL EFFECTS;
EXPANDERS;
LEAD ACID BATTERIES;
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EID: 0037457919
PISSN: 03787753
EISSN: None
Source Type: Journal
DOI: 10.1016/S0378-7753(02)00546-3 Document Type: Conference Paper |
Times cited : (18)
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References (20)
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