Imaging of vortex configurations in thin films by scanning-tunneling microscopy

Applied Physics Letters

Volumn 82, Issue 7, 2003, Pages 1081-1083

  Van Baarle, G J C ^a   Troianovski, A M ^a,b   Nishizaki, T ^a,c   Kes, P H ^a   Aarts, J ^a  

^a LEIDEN UNIVERSITY   (Netherlands)

^b KAPITZA INSTITUTE FOR PHYSICAL PROBLEMS   (Russian Federation)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LATTICE CONSTANTS; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; ULTRATHIN FILMS;

VORTEX LATTICES;

SUPERCONDUCTING FILMS;

EID: 0037450255     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1554481     Document Type: Article

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