Ferroelectric smectic phase formed by achiral straight core mesogens

Physical Review Letters

Volumn 90, Issue 2, 2003, Pages

  Stannarius, Ralf ^a   Li, Jianjun ^a   Weissflog, Wolfgang ^b  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALORIMETRY; ELECTRIC FIELDS; ELECTROOPTICAL EFFECTS; FERROELECTRIC MATERIALS; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; ORGANIC COMPOUNDS; PHASE TRANSITIONS; STRUCTURE (COMPOSITION); TEMPERATURE; X RAY ANALYSIS; X RAY SCATTERING;

ACHIRAL STRAIGHT CORE MESOGENS; DYNAMIC SCANNING CALORIMETRY MEASUREMENTS; FERROELECTRIC SMECTIC PHASE; LIQUID CRYSTALLINE FREESTANDING FILM; MOLECULAR CONFIGURATION;

SMECTIC LIQUID CRYSTALS;

EID: 0037449880     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (22)

1. R.B. Meyer, L. Liebert, L.Strzelecki, and P. Keller, J. Phys. Lett. 36, L69 (1975)
2. R.B. Meyer, Ferroelectrics 28, 319 (1980).
3. T. Niori, F. Sekine, J. Watanabe, T. Furukawa, and H. Takezoe, J. Mater. Chem. 6, 1231 (1996)
4. T. Sekine, Y. Takanashi, J. Watanabe, and H. Takezoe, Jpn. J. Appl. Phys. 36, L1201 (1997).
5. D.R. Link, G. Natale, R. Shao, J. E. Maclennan, N.A. Clark, E. Körblova, and D.M. Walba, Science 278, 1924 (1997).
6. D.M. Walba, E. Körblova, R. Shao, J.E. Maclennan, D.R. Link, M.A. Glaser, and N.A. Clark, Science 288, 2181 (2000).
7. G. Pelzl, S. Diele, and W. Weissflog, Adv. Mater. 11, 707 (1999).
8. W. Weissflog, H. Nadasi, U. Dunemann, G. Pelzl, S. Diele, A. Eremin, and H. Kresse, J. Mater. Chem. 11, 2748 (2001).
9. A. Jakli, D. Kruerke, H. Sawade, and G. Heppke, Phys. Rev. Lett. 86, 5715 (2001).
10. M. Hird, J.W. Goodby, N. Gough, and K.J. Toyne, J. Mater. Chem. 11, 2732 (2001).
11. B. Das, S. Grande, A. Eremin, M. Schöder, S. Diele, G. Pelzl, H. Kresse, and W. Weissflog, Liq. Cryst. (to be published).
12. D. Link et al., Phys. Rev. Lett. 84, 5772 (2000), and references therein.
13. P.E. Cladis, P.L. Finn, and H.R. Brand, Phys. Rev. Lett. 75, 1518 (1995)
14. P.E. Cladis and H.R. Brand, Liq. Cryst. 14, 1327 (1993).
15. C. Escher, T. Geelhaar, and E. Böhm, Liq. Cryst. 3, 469 (1988).
16. R. Stannarius, N. Klöpper, Th. Fischer, and F. Kremer, Phys. Rev. E 58, 6884 (1998).
17. C. Chevallard, J.-M. Gilli, T. Frisch, I.V. Chikina, and P. Pieranski, Mol. Cryst. Liq. Cryst. 328, 595 (1999).
18. G. Hauck, H.D. Koswig, and C. Selbmann, Liq. Cryst. 21, 847 (1996)
19. G. Hauck and H.D. Koswig, Ferroelectrics 122, 253 (1995).
20. R. Najjar and Y. Galerne, Mol. Cryst. Liq. Cryst. 366, 2273 (2001).
21. The convection threshold increases approximately linearly with film thickness; see, e.g., S.W. Morris, J.R. de Bruyn, and A.D. May, Phys. Rev. Lett. 65, 2378 (1990)
22. S.W. Morris, J.R. de Bruyn, and A.D. May, Phys. Rev. A 44, 8146 (1991).