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Volumn 104, Issue 2, 2003, Pages 117-120
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Highly sensitive near IR detectors using n-type porous Si
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Author keywords
Avalanche photodiodes; IR detectors; Porous Si; PtSi Schottky detectors
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Indexed keywords
AVALANCHE DIODES;
CURRENT VOLTAGE CHARACTERISTICS;
ETCHING;
PHOTODIODES;
PORE SIZE;
POROUS SILICON;
ULTRAVIOLET RADIATION;
ANODIC ETCHING;
INFRARED DETECTORS;
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EID: 0037446421
PISSN: 09244247
EISSN: None
Source Type: Journal
DOI: 10.1016/S0924-4247(02)00435-1 Document Type: Article |
Times cited : (20)
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References (8)
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