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Volumn 41, Issue 8, 2003, Pages 823-841

Structure-electrical property study of anisotropic polyaniline films

Author keywords

FT IR; Impedance spectroscopy; Polyaniline; Refractive index; X ray

Indexed keywords

ANISOTROPY; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROCHLORIC ACID; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; POLARIZATION; REFRACTIVE INDEX; X RAY DIFFRACTION ANALYSIS;

EID: 0037446365     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.10430     Document Type: Article
Times cited : (17)

References (42)
  • 18
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    • Ramamurthy, P. Clemson University, Clemson, SC. Private communication, 1998.
    • (1998)
    • Ramamurthy, P.1
  • 19
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    • Blake Industries, Inc., Scotch Plains, NJ.
  • 20
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    • Molecular Dynamics, Inc., Sunnyvale, CA
    • Molecular Dynamics, Inc., Sunnyvale, CA.
  • 21
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    • Metricon Corp., Pennington, NJ
    • Metricon Corp., Pennington, NJ.
  • 24
    • 0012775776 scopus 로고    scopus 로고
    • SPI Supplies, West Chester, PA
    • SPI Supplies, West Chester, PA.
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    • Model 4192A, Hewlett-Packard Corp., Palo Alto, CA
    • Model 4192A, Hewlett-Packard Corp., Palo Alto, CA.
  • 35
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    • SPI 5002, SPI Supplies, West Chester, PA
    • SPI 5002, SPI Supplies, West Chester, PA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.