AFM observation of as-grown (1 1 9) Bi-2223 and (1 0 3) Y-123 thin films by MOCVD

Physica C: Superconductivity and its Applications

Volumn 386, Issue , 2003, Pages 292-295

  Endo, K ^a   Badica, P ^a,b   Itoh, J ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

(1 0 3) Y 123; (1 1 9) B 2223; Critical temperature; Growth mechanism; Morphology

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH; FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; YTTRIUM;

GROWTH MECHANISM;

THIN FILM CIRCUITS;

EID: 0037445642     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)02136-6     Document Type: Conference Paper

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