MBE growth and structural characterization of ZnS1-xSex thin films on ITO/glass substrates

Journal of Materials Science Letters

Volumn 22, Issue 6, 2003, Pages 483-487

  Shen, D ^a,b   Au, S Y ^a   Han, G ^b   Que, D ^b   Wang, N ^a   Sou, I K ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; GLASS; LIQUID CRYSTALS; MOLECULAR BEAM EPITAXY; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC COMPOUNDS;

GLASS SUBSTRATES;

THIN FILMS;

EID: 0037445172     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022992502295     Document Type: Article

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