Photothermal imaging of localized delamination between organic coatings, metallic substrates using a scanning photopyroelectric microscope

Journal of Applied Physics

Volumn 93, Issue 4, 2003, Pages 2019-2027

  Van den Brand, J ^a   Chirtoc, M ^b   Wubbenhorst M R ^c   De Wit, J H W ^c  

^a NETHERLANDS INSTITUTE FOR METALS RESEARCH   (Netherlands)

^b NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT OF ISOTOPIC AND MOLECULAR TECHNOLOGIES   (Romania)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; DELAMINATION; FINITE ELEMENT METHOD; INFRARED IMAGING; SUBSTRATES;

PHOTOTHERMAL IMAGING;

ORGANIC COATINGS;

EID: 0037443013     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1539293     Document Type: Article

References (28)

1. T. Nguyen, Mater. Charact. 28, 291 (1992).
2. P. M. Patel, Appl. Phys. B: Photophys. Laser Chem. 43, 9 (1987).
3. M. M. Moksin, J. Mater. Sci. 30, 2251 (1995).
4. S. Parthasarathi, Mater. Manuf. Processes 10, 1077 (1995).
5. G. Busse and K. F. Renk, Appl. Phys. Lett. 42, 366 (1983).
6. M. Vaez Iravani and H. K. Wickramasinghe, J. Appl. Phys. 58, 122 (1985).
7. A. Rosencwaig, Am. Lab. (Shelton, Conn.) 11, 39 (1979).
8. P. E. Nordal and S. O. Kanstad, in Scanned Image Microscopy, edited by E. A. Ash (Academic, London, 1980), p. 331.
9. R. L. Thomas, L. D. Favro, K. R. Grice, L. J. Inglehart, P. K. Kuo, J. Lhota, and G. Busse, Proceedings of the Institute of Electrical and Electronics Engineers Ultrasonic Symposium (IEEE, New York, 1982), p. 586.
10. G. Busse and H. G. Walther, in Progress of Photothermal and PhotoacousticScience and Technology, edited by A. Mandelis (Elsevier, New York, 1992), Vol. 1, p. 206.
11. M. Munidasa and A. Mandelis, in Progress of Photothermal and PhotoacousticScience and Technology, edited by A. Mandelis (Elsevier, New York, 1992), Vol. 1, p. 300.
12. M. Luukkala, in Scanned Image Microscopy, edited by E. A. Ash (Academic, London, 1980), p. 273.
13. C. R. Petts and H. K. Wikramasinghe, Proceedings of the Institute of Electrical and Electronics Engineeres Ultrasonic Symposium (IEEE, New York, 1981), p. 832.
14. M. Mieszkowski, K. F. Leung, and A. Mandelis, Rev. Sci. Instrum. 60, 306 (1989).
15. M. Mieszkowski and A. Mandelis, J. Opt. Soc. Am. A 7, 552 (1990).
16. M. Wübbenhorst, J. van Turnhout, A. Quintel, and J. Hulliger, J. Appl. Phys. 88, 2108 (2000).
17. Z. Bozóki and A. Miklós, Appl. Phys. Lett. 64, 1362 (1994).
18. A. Mandelis, J. Opt. Soc. Am. A 6, 298 (1989).
19. L. C. Aamodt and J. C. Murphy, J. Appl. Phys. 52, 4903 (1981).
20. O. Padé and A. Mandelis, Inverse Probl. 10, 185 (1994).
21. J.-B. Thibaud, R. Carminati, and J.-J. Greffet, J. Appl. Phys. 87, 7638 (2000).
22. U. Seidel, K. Haupt, H. G. Walther, J. A. Burt, and M. Munidasa, J. Appl. Phys. 78, 2050 (1995).
23. O. O. Diniz Neto and C. A. S. Lima, J. Phys. D 27, 1795 (1994).
24. A. Mandelis and M. M. Zver, J. Appl. Phys. 57, 4421 (1985).
25. M. Chirtoc and G. Mihailescu, Phys. Rev. B 40, 9606 (1989).
26. M. Chirtoc, J. S. Antoniow, and M. Egée, Photoacoustic and Photothermal Phenomena Xth Int. Conf., Rome, Italy, 1998, edited bye Scudieri and M. Bertolotti (American Institute of Physics, Woodbury, New York, 1999), pp. 84-86.
27. Handbook of Chemistry and Physics, 78th ed., edited by D. R. Lide (Chemical Rubber Corp., Boca Raton, Fl., 1998).
28. G. Gerliczy and R. Betz, Sens. Actuators 13, 207 (1987).