X-ray photoelectron spectroscopic study of rare-earth-doped amorphous silicon-nitrogen films

Journal of Applied Physics

Volumn 93, Issue 4, 2003, Pages 1948-1953

  Zanatta, A R ^a   Ribeiro, C T M ^b   Alvarez, F ^b  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DOPING (ADDITIVES); POSITIVE IONS; RARE EARTH ELEMENTS; SILICON NITRIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY SHIFT;

AMORPHOUS FILMS;

EID: 0037442471     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1536015     Document Type: Article

References (23)

1. F. A. Cotton, G. Wilkinson, and P. L. Gauss, Basic Inorganic Chemistry (Wiley, New York, 1987).
2. Rare-Earth Minerals: Chemistry, Origin, and Ore Deposits, edited by A. P. Jones, F. Wall, and C. T. Williams (Chapman & Hall, London, 1996).
3. T. Moeller, The Chemistry of the Lanthanides, Comprehensive Inorganic Chemistry (Pergamon, London, 1975), Chap. 44.
4. K. Patek, in Glass Lasers, edited by J. G. Edwards (Chemical Rubber Corp., U.K., 1970).
5. F. Gan, Laser Materials (World Scientific, MA, 1995).
6. Mater. Res. Soc. Bull. 23, No. 4, Material Research Society, Pittsburgh (1998).
7. Mater. Res. Soc. Bull. 24, No. 9, Materials Research Society, Pittsburgh (1999).
8. Rare-Earth Doped Semiconductors II, edited by S. Coffa, A. Polman, and R. Schwartz (Material Research Society, Pittsburgh, 1996), Vol. 422.
9. A. R. Zanatta and F. L. Freire, Jr., Phys. Rev. B 62, 2016 (2000).
10. For a review on the subject see M. Campagna, G. K. Wertheim, and Y. Bauer, in Photoemission in Solids II, Topics in Applied Physics, Vol. 28, edited by L. Ley and M. Cardona (Springer, Berlin, 1978), p. 217.
11. K. Hafidi, Y. Ijdiyaou, M. Azizan, E. L. Ameziane, A. Outzourhit, T. A. N. Tan, and M. Brunel, Appl. Surf. Sci. 108, 251 (1997).
12. A. R. Zanatta, M. J. V. Bell, and L. A. O. Nunes, Phys. Rev. B 59, 10091 (1999).
13. J. H. Scofield, J. Electron Spectrosc. Relat. Phenom. 8, 129 (1976).
14. S. Y. Ren and W. Y. Ching, Phys. Rev. B 23, 5454 (1981).
15. R. Karcher, L. Ley, and R. L. Johnson, Phys. Rev. B 30, 1896 (1984).
16. Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy, Vol. 1, edited by D. Briggs and M. P. Seah (Wiley, New York, 1990).
17. J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, in Handbook of X-ray Photoelectron Spectroscopy, edited by J. Chastain (Perkin-Elmer, MN, 1992).
18. B. D. Padalia, W. C. Lang, P. R. Norris, L. M. Watson, and D. J. Fabian, Proc. R. Soc. London, Ser. A 354, 269 (1977).
19. A. R. Zanatta and I. Chambouleyron, Solid State Commun. 95, 207 (1995).
20. A. R. Zanatta, R. Landers, S. Castro, G. Kleiman, I. Chambouleyron, and M. Grilli, Appl. Phys. Lett. 66, 1258 (1995).
21. A. R. Zanatta, P. Hammer, and F. Alvarez, Appl. Phys. Lett. 76, 2211 (2000).
22. J. F. Herbst, D. N. Lowy, and R. E. Watson, Phys. Rev. B 6, 1913 (1972).
23. See, for example, C. T. M. Ribeiro, F. Alvarez, and A. R. Zanatta, Adv. Mater. 14, 1154 (2002).