Study of stress effects in the oxidation of phosphated α-iron: In situ measurement by diffraction of synchrotron radiation

Applied Surface Science

Volumn 206, Issue 1-4, 2003, Pages 149-158

  Panicaud, B ^a   Grosseau Poussard, J L ^a   Renault, P O ^b   Dinhut, J F ^a   Thiaudiere D ^c   Gailhanou, M ^c  

^a UNIVERSITÉ DE LA ROCHELLE   (France)

^b UNIVERSITÉ DE POITIERS   (France)

^c UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

High temperature oxidation; Iron; Kinetics; Phosphate layer; Residual stresses; X ray diffraction

Indexed keywords

HIGH TEMPERATURE EFFECTS; OXIDATION; RESIDUAL STRESSES; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

HIGH TEMPERATURE OXIDATION;

IRON;

EID: 0037441187     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01193-5     Document Type: Article

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