Hackle or textured mirror? Analysis of surface perturbation in single crystal silicon

Journal of Materials Science

Volumn 38, Issue 4, 2003, Pages 783-788

  Sherman, Dov ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK PROPAGATION; FRACTURE; SINGLE CRYSTALS; SURFACES;

LOCAL CRACK FRONT VELOCITY; LOCAL CRACK TIP VELOCITY; SURFACE PERTURBATION; THREE-POINT BENDING;

SILICON;

EID: 0037441037     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1021809014702     Document Type: Article

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