Multiple internal reflection spectroscopy for quantitative infrared analysis of thin-film surface coating for biological environment

Materials Science and Engineering C

Volumn 23, Issue 1-2, 2003, Pages 99-103

  Rochat, N ^a   Troussier, A ^a   Hoang, A ^a   Vinet, F ^a  

^a CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; GRAFTING (CHEMICAL); HYDROXYLATION; INFRARED SPECTROSCOPY; MOLECULES; SILICA;

MULTIPLE INTERNAL REFLECTION (MIR);

THIN FILMS;

FILM;

EID: 0037439968     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(02)00239-4     Document Type: Article

References (8)

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2. N.J. Harrick, Internal Reflection Spectroscopy, Wiley, New York, 1967.
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4. N. Rochat, M. Olivier, F. Conne, G. Lefeuvre, C. Boll-Burdet, Appl. Phys. Lett. 77 (14) (2000).
5. K.M. Davis, M. Tomozawa, J. Non-Cryst. Solids A 13 (3) (1995) 203-220.
6. D. Faijoo, Y.J. Chabal, S.B. Christman, Appl. Phys. Lett. 65 (20) (1994).
7. R.K. Iler, The Chemistry of Silica, Ed. Wiley, 1979.
8. K. Nakanishi, P.H. Solomon, Infrared Absorption Spectroscopy, 2nd ed., Holden-Day, Oakland, 1977.