Effect of composition and deposition parameters on optical properties of Ge25Sb15-xBixS60 thin films

Thin Solid Films

Volumn 423, Issue 2, 2003, Pages 201-211

  El Samanoudy, M M ^a  

^a Ain Shams University   (Egypt)

Author keywords

Ge25Sb15 xBixS60 chalcogenide films; Optical properties; Scanning electron microscopy

Indexed keywords

ELECTRIC CONDUCTIVITY; GLASS TRANSITION; LIGHT ABSORPTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTOR DOPING; X RAY DIFFRACTION ANALYSIS;

OPTICAL ENERGY;

THIN FILMS;

EID: 0037439682     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01042-8     Document Type: Article

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