High precision isotope micro-imaging of materials

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 793-797

  Yurimoto, Hisayoshi ^a   Nagashima, Kazuhide ^a   Kunihiro, Takuya ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Imaging; Ion detector; Isotope; Meteorite; Oxygen; SIMS

Indexed keywords

IMAGING TECHNIQUES; OXYGEN; SECONDARY ION MASS SPECTROMETRY; SURFACE TOPOGRAPHY;

ISOTOPE MICRO-IMAGING;

ISOTOPES;

EID: 0037438250     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00825-5     Document Type: Conference Paper

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