Nanocrystals depth profiling by means of Cs + in negative polarity with dual beam ToF-SIMS

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 110-113

  Perego, M ^a   Ferrari, S ^a   Spiga, S ^a   Fanciulli, M ^a  

^a LABORATORIO MDM   (Italy)

Author keywords

Antimony nanocrystals; ToF SIMS

Indexed keywords

ANTIMONY; CESIUM; CRYSTALS; IONIZATION; OXIDATION; POSITIVE IONS; SECONDARY ION MASS SPECTROMETRY; SILICA;

NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 0037438239     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00710-9     Document Type: Conference Paper

References (3)

1. S. Spiga, S. Ferrari, M. Fanciulli, B. Schmidt, K.H. Heinig, R. Grötzschel, A. Mücklich, G. Pavia, Mater. Res. Soc. Symp. 647 (2001).
2. C. Plog, L. Wiedmann, A. Benninghoven, Surf. Sci. 67 (1977).
3. M.L. Yu, Phys. Rev. Lett. 40 (1978).