Genome diagnostics with TOF-SIMS

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 689-692

  Arlinghaus, H F ^a   Ostrop, M ^a   Friedrichs, O ^a   Feldner, J C ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Biosensor; DNA; Hybridization; Mass spectrometry; PNA; TOF SIMS

Indexed keywords

BIOSENSORS; DNA; GENES; PHOSPHATES; POLYPEPTIDES; SECONDARY ION MASS SPECTROMETRY;

BIOSENSOR CHIPS;

SURFACE PROPERTIES;

EID: 0037438225     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00792-4     Document Type: Conference Paper

References (5)

1. Arlinghaus H.F., Kwoka M.N., Jacobson K.B. Anal. Chem. 69:1997;3747.
2. H.F. Arlinghaus, C. Höppener, J. Drexler, in: A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry (SIMS XII), Elsevier, Amsterdam, 2000, pp. 951-954.
3. Nielsen P.E. Curr. Opin. Biotechnol. 10:1999;71.
4. Diehl F., Grahlmann S., Beier M., Hoheisel J.D. Nucl. Acids Res. 29:2001;E38.
5. J. Feldner, et al., this proceedings.