Superstructure and finite-size effects in a Si photonic woodpile crystal

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 3, 2003, Pages

  De Dood, M J A ^a   Gralak, B ^a   Polman, A ^a   Fleming, J G ^b  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; CONTRAST ENHANCEMENT; CRYSTAL STRUCTURE; DATA ANALYSIS; ELECTRON MICROSCOPY; MEASUREMENT; ORIENTATION; POLARIZATION; SEMICONDUCTOR; STRUCTURE ANALYSIS; THICKNESS;

EID: 0037438108     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.035322     Document Type: Article

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