Microchannel-assisted thermal-lens spectrometry for microchip analysis

Journal of Chromatography A

Volumn 987, Issue 1-2, 2003, Pages 197-204

  Tamaki, Eiichiro ^a   Hibara, Akihide ^a   Tokeshi, Manabu ^b   Kitamori, Takehiko ^a,b,c  

^a UNIVERSITY OF TOKYO   (Japan)

^b KANAGAWA ACADEMY OF SCIENCE AND TECHNOLOGY   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Chip technology; Instrumentation; Thermal lens spectrometry

Indexed keywords

ELECTRIC EXCITATION; IRRADIATION; LASER BEAMS; LIGHT SOURCES; THERMAL CONDUCTIVITY;

MICROCHIPS; PHOTOTHERMAL EFFECTS;

SPECTROMETRY;

ACCURACY; ANALYTIC METHOD; CONFERENCE PAPER; FREQUENCY MODULATION; IRRADIATION; LASER; LIQUID; MICROCHANNEL ASSISTED THERMAL LENS SPECTROMETRY; PRIORITY JOURNAL; SOLID; SPECTROMETRY;

SEMICONDUCTORS; SENSITIVITY AND SPECIFICITY; SPECTROPHOTOMETRY;

EID: 0037435956     PISSN: 00219673     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0021-9673(02)01661-8     Document Type: Conference Paper

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