Correlation of molecular assembly and interactions in crystals and Langmuir - Blodgett films of N-(2,4-dinitrophenyl)-n-octadecylamine

ChemPhysChem

Volumn 4, Issue 1, 2003, Pages 67-71

  Sharma, Sonika ^a   Radhakrishnan, T P ^a  

^a UNIVERSITY OF HYDERABAD   (India)

Author keywords

Langmuir Blodgett films; Semiempirical calculations; Structure elucidation; UV Vis spectroscopy

Indexed keywords

AIR; COMPOSITE FILMS; CRYSTAL STRUCTURE; MONOLAYERS; PHASE INTERFACES; PHOSPHOLIPIDS; SINGLE CRYSTALS; THIN FILM TRANSISTORS; ULTRATHIN FILMS; ULTRAVIOLET VISIBLE SPECTROSCOPY;

ELECTRONIC ABSORPTION SPECTRA; MOLECULAR ORGANIZATION; NONLINEAR OPTICAL APPLICATIONS; PHOSPHOLIPID MOLECULES; SEMI-EMPIRICAL CALCULATION; STRUCTURE DETERMINATION; STRUCTURE ELUCIDATION; UV/ VIS SPECTROSCOPY;

LANGMUIR BLODGETT FILMS;

N (2,4 DINITROPHENYL) N OCTADECYLAMINE; OCTADECYLAMINE; PHOSPHOLIPID; UNCLASSIFIED DRUG;

ARTICLE; COMPOSITE MATERIAL; COMPUTER MODEL; CORRELATION ANALYSIS; CRYSTAL; CRYSTAL STRUCTURE; CRYSTALLIZATION; FILM; HYDROPHILICITY; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; MOLECULAR MODEL; NONLINEAR SYSTEM; OSCILLATION; SOLID STATE; STRUCTURE ANALYSIS; SUPRAMOLECULAR CHEMISTRY; ULTRAVIOLET SPECTROSCOPY;

EID: 0037434336     PISSN: 14394235     EISSN: None     Source Type: Journal    
DOI: 10.1002/cphc.200390010     Document Type: Article

References (36)

1. a) J. Zyss, G. J. Berthier, J. Chem. Phys. 1982, 77, 3635;
2. b) I. Ledoux, J. Zyss, Chem. Phys. 1982, 73, 203;
3. c) P. Gangopadhyay, T. P. Radhakrishnan, Angew. Chem. Int. Ed. 2001, 40, 2451; Angew. Chem. 2001, 113, 2517;
4. c) P. Gangopadhyay, T. P. Radhakrishnan, Angew. Chem. Int. Ed. 2001, 40, 2451; Angew. Chem. 2001, 113, 2517;
5. d) P. K. Thallapally, G. R. Desiraju, M. Bagieu-Beucher, R. Masse, C. Bourgogne, J.-F. Nicoud, Chem. Commun. 2002, 1052.
6. a) G. Roberts, Langmuir - Blodgett Films, Plenum Press, New York, 1990;
7. b) R. H. Tredgold, Order in Thin Organic Films, Cambridge University Press, Cambridge, 1994;
8. c) M. C. Petty, Langmuir-Blodgett Films - An Introduction, Cambridge University Press, Cambridge, 1996.
9. I. Kuzmenko, H. Rapaport, K. Kjaer, J. Als-Nielsen, I. Weissbuch, M. Lahav, L. Leiserowitz, Chem. Rev. 2001, 101, 1659.
10. a) J. L. Oudar, R. Hierle, J. Appl. Phys. 1977, 48, 2699;
11. b) J. Zyss, J.-F. Nicoud, M. Coquillay, J. Chem. Phys. 1984, 81, 4160;
12. c) A. M. Moran, A. M. Kelley, J. Chem. Phys. 2001, 115, 912;
13. d) G. Mansour, W. Creedon, P. C. Dorrestein, J. Maxka, J. C. MacDonald, R. Helburn, J. Org. Chem. 2001, 66, 4050.
14. a) T. Inoue, K. Yase, M. Okada, S. Okada, H. Matsuda, H. Nakanishi, M. Kato, Jpn. J. Appl. Phys. 1988, 27, 1635;
15. b) Y. Miyamoto, K. Kaifu, M. Saito, M. Kato, K. Kawamura, Thin Solid Films 1989, 178, 493;
16. c) D. Shin, M. Park, S. Lim, Thin Solid Films 1998, 327-329, 607;
17. d) H. S. Nalwa, T. Watanabe, K. Ogino, H. Sato, S. Miyata, J. Mater. Sci. 1998, 33, 3699;
18. e) R. W. Munn, O. Szczur, Mol. Cryst. Liq. Cryst. 2001, 355, 305.
19. S. Sharma, T. P. Radhakrishnan, J. Phys. Chem. B, in press.
20. G. Decher, B. Tieke, C. Bosshard, P. Günter, Ferroelectrics 1989, 91, 193.
21. S. Sharma, M. Sharath Chandra, T. P. Radhakrishnan, Langmuir 2001, 17, 8118.
22. a) M. A. Bos, T. Nylander, Langmuir 1996, 12, 2791;
23. b) S. Sharma, T. P. Radhakrishnan, Thin Solid Films 2001, 382, 246.
24. A. P. Girard-Egrot, R. M. Morélis, P. R. Coulet, Langmuir 1996, 12, 778.
25. 2 = 0.1514.
26. P. Gangopadhyay, T. P. Radhakrishnan, Chem. Mater. 2000, 12, 3362.
27. a) P. Gangopadhyay, N. K. M. Naga Srinivas, D. N. Rao, T. P. Radhakrishnan, Opt. Mater. 2002, 21, 55;
28. b) Cambridge Structural Database, Version 5.2; http://www.ccdc.cam.ac.uk/isostar/appnot2.html.
29. G. R. Desiraju, Acc. Chem. Res. 2002, 35, 567.
30. CCDC-192215 contains the supplementary crystallographic data for this paper. These data can be obtained free of charge via www.ccdc.cam.ac.uk/conts/retrieving.html (or from the Cambridge Crystallographic Data Centre, 12 Union Road, Cambridge C132 1EZ, UK; fax; (+44) 1223-336-033; or deposit@ccdc.cam.ac.uk).
31. M. J. S. Dewar, E. G. Zoebisch, E. F. Healy, J. J. P. Stewart, J. Am. Chem. Soc. 1985, 107, 3902.
32. MOPAC93 Fujitsu Inc, Tokyo, Japan, 1993.
33. ZINDO available in Gaussian 98 was used; Gaussian 98 (Revision A. 10), M. J. Frisch, G. W. Trucks, H. B. Schlegel, G. E. Scuseria, M. A. Robb, J. R. Cheeseman, V. G. Zakrzewski, J. A. Montgomery, Jr., R. E. Stratmann, J. C. Burant, S. Dapprich, J. M. Millam, A. D. Daniels, K. N. Kudin, M. C. Strain, O. Farkas, J. Tomasi, V. Barone, M. Cossi, R. Cammi, B. Mennucci, C. Pomelli, C. Adamo, S. Clifford, J Ochterski, G. A. Petersson, P. Y. Ayala, Q. Cui, K. Morokuma, P. Salvador, J. J. Dannenberg, D. K. Malick, A. D. Rabuck, K. Raghavachari, J. B. Foresman, J. Cioslowski, J. V. Ortiz, A. G. Baboul, B. B. Stefanow, G. Liu, A. Liashenko, P. Piskorz, I. Komaromi, R. Gomperts, R. L. Martin, D. J. Fox, T. Keith, M. A. Al-Laham, C. Y. Peng, A. Nanayakkara, M. Challacombe, P. M. W. Gill, B. Johnson, W. Chen, M. W. Wong, J. L. Andres, C. Gonzalez, M. Head-Gordon, E. S. Replogle, and J. A. Pople, Gaussian, Inc., Pittsburgh PA 2001.
34. A. Klamt, G. Shüürmann, J. Chem. Soc. Perkin Trans. 2 1993, 799.
35. a) S. Sharma, T. P. Radhakrishnan, J. Phys. Chem. B 2000, 104, 10191;
36. b) S. Jayanty, T. P. Radhakrishnan, Chem. Mater. 2001, 13, 24601.