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Volumn 348, Issue 1-2, 2003, Pages 157-166
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The Ag2Se-HgSe-SiSe2 system in the 0-60 mol.% SiSe2 region
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Author keywords
Crystal structure; Phase diagram; Semiconductors; X ray diffraction
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Indexed keywords
ANISOTROPY;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
EUTECTICS;
ISOTHERMS;
PHASE DIAGRAMS;
X RAY ANALYSIS;
X RAY DIFFRACTION;
PHASE EQUILIBRIA;
TERNARY SYSTEMS;
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EID: 0037433887
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-8388(02)00846-0 Document Type: Article |
Times cited : (16)
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References (20)
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