Ultrathin Co films on flat and vicinal Cu(111) surfaces: Per atom determination of orbital and spin moments

Journal of Physics Condensed Matter

Volumn 15, Issue 5, 2003, Pages

  Hahlin, A ^a   Dunn, J Hunter ^b   Karis, O ^a   Poulopoulos, P ^c,d   Nunthel R ^c   Lindner, J ^c   Arvanitis, D ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b MAX IV LABORATORY   (Sweden)

^c FREIE UNIVERSITÄT BERLIN   (Germany)

^d UNIVERSITY OF PATRAS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; COBALT; COPPER; FILM GROWTH; LIGHT ABSORPTION; LIGHT REFLECTION; MAGNETIC MOMENTS; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; THICKNESS MEASUREMENT; X RAY ANALYSIS;

ORBITAL AND SPIN MOMENTS; ULTRATHIN COBALT FILMS; X RAY ABSORPTION MEASUREMENT; X RAY MAGNETIC CIRCULAR DICHROISM; X RAY REFLECTIVITY MEASUREMENT; X RAY RESONANT MAGNETIC SCATTERING;

ULTRATHIN FILMS;

EID: 0037433299     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/5/311     Document Type: Article

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