Growth of thin Bi films on W (1 1 0)

Surface Science

Volumn 527, Issue 1-3, 2003, Pages 51-56

  Koitzsch, C ^a   Bovet, M ^a   Clerc, F ^a   Naumovic D ^a   Schlapbach, L ^a   Aebi, P ^a  

^a UNIVERSITY OF FRIBOURG   (Switzerland)

Author keywords

Bismuth; Growth; Low energy electron diffraction (LEED); Photoelectron diffraction measurement; Tungsten

Indexed keywords

BISMUTH; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; LOW ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; THIN FILMS; TUNGSTEN; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL FILMS;

EPITAXIAL GROWTH;

EID: 0037430625     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02534-7     Document Type: Article

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