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note
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(a) SMART and SAINT programs were used for data collection and data processing (Siemens Analytical X-ray Instruments, Inc., Madison, WI).
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G. M. Sheldrick, University of Goettingen, Germany, 1996
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(b) SADABS was used for the application of semiempirical absorption and beam corrections (G. M. Sheldrick, University of Goettingen, Germany, 1996).
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19
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G. M. Sheldrick, University of Goettingen, Germany and Siemens Analytical X-ray Instruments, Inc., Madison, WI
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(c) SHELXTL was used for the structure solution and generation of figures and tables (G. M. Sheldrick, University of Goettingen, Germany and Siemens Analytical X-ray Instruments, Inc., Madison, WI).
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