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Volumn 367, Issue 5-6, 2003, Pages 645-650

Characterization of SiN and other transient species in a silicon tetrachloride-nitrogen discharge

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0037427755     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(02)01793-1     Document Type: Article
Times cited : (4)

References (14)
  • 8
    • 0026365964 scopus 로고
    • Wavenumber Calibration Tables from Heterodyne Frequency Measurements
    • NIST Special Publ. 821
    • A.G. Maki and J.S. Wells, Wavenumber Calibration Tables from Heterodyne Frequency Measurements, NIST Special Publ. 821, 1991.
    • (1991)
    • Maki, A.G.1    Wells, J.S.2
  • 12
    • 0003840268 scopus 로고    scopus 로고
    • Optical Diagnostics for Thin Film Processing
    • Acadamic Press, San Diego, USA
    • I.P. Herman, Optical Diagnostics for Thin Film Processing, Acadamic Press, San Diego, USA, 1996.
    • (1996)
    • Herman, I.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.