Self-affine roughness effects on the double-layer charge density and capacitance in the nonlinear regime

Journal of Chemical Physics

Volumn 118, Issue 10, 2003, Pages 4631-4635

  Palasantzas, G ^a   Backx, G M E A ^b  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

^b Computational Physics Centre ^*  (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRODES; ELECTROLYTES; INTERFACES (MATERIALS); MATHEMATICAL MODELS; VOLTAGE MEASUREMENT;

CHARGE DENSITY; DEBYE LENGTHS; HELMHOLTZ LAYER; WAVELENGTH ROUGHNESS;

SURFACE ROUGHNESS;

EID: 0037426228     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1545092     Document Type: Article

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