Direct imaging of Sc2Γ84 molecules encapsulated inside single-wall carbon nanotubes by high resolution electron microscopy with atomic sensitivity

Physical Review Letters

Volumn 90, Issue 5, 2003, Pages

  Suenaga, K ^a,b   Okazaki, T ^c   Wang, C R ^c,d   Bandow, S ^b   Shinohara, H ^c   Iijima, S ^a,b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b MEIJO UNIVERSITY   (Japan)

^c NAGOYA UNIVERSITY   (Japan)

^d INSTITUTE OF CHEMISTRY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; ELECTRON BEAMS; ENCAPSULATION; FULLERENES; HIGH RESOLUTION ELECTRON MICROSCOPY; IRRADIATION; ISOMERS; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; SCANDIUM; X RAY DIFFRACTION ANALYSIS;

ATOMIC ARRANGEMENT; ATOMIC SENSITIVITY; ELECTRON BEAM IRRADIATION; MOLECULAR SYMMETRY; SINGLE WALL CARBON NANOTUBES; STRUCTURAL ISOMERS;

CARBON NANOTUBES;

EID: 0037422974     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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