Electrical properties, crystallization kinetics and structure of microcrystalline Pb0.45Sn0.14Te0.39In0.02 system

Materials Chemistry and Physics

Volumn 79, Issue 1, 2003, Pages 15-20

  Adam, A ^a   Wahab, L A ^b   Sedeek, K ^a  

^a Assiut Branch   (Egypt)

^b National Center for RRT   (Egypt)

Author keywords

Electrical conductivity; Kinetics of crystallization; Microcrystalline structure

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; LATTICE CONSTANTS; MICROHARDNESS; X RAY DIFFRACTION ANALYSIS;

HYDROSTATIC DENSITY;

LEAD COMPOUNDS;

EID: 0037420042     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(02)00293-6     Document Type: Article

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