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Volumn 427, Issue 1-2, 2003, Pages 355-357

Parameters for photoelectronic characterisation and the Fermi level in amorphous silicon

Author keywords

Amorphous silicon; Diffusion length; Electronic properties; Photoconductivity

Indexed keywords

DIFFUSION; ELECTRON MOBILITY; FERMI LEVEL; HOLE MOBILITY; HYDROGENATION; NANOSTRUCTURED MATERIALS; PHOTOCONDUCTIVITY; SEMICONDUCTOR DOPING;

EID: 0037416721     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01227-0     Document Type: Conference Paper
Times cited : (7)

References (11)
  • 10
    • 0000768503 scopus 로고
    • Electronic transport in hydrogenated amorphous semiconductors
    • Höhl G., Niekisch E.A., Heidelberg: Springer Verlag
    • Overhof H., Thomas P. Electronic transport in hydrogenated amorphous semiconductors. Höhl G., Niekisch E.A. Springer Tracts in Modern Physics 114. 1989;Springer Verlag, Heidelberg.
    • (1989) Springer Tracts in Modern Physics , vol.114
    • Overhof, H.1    Thomas, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.