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Volumn 427, Issue 1-2, 2003, Pages 355-357
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Parameters for photoelectronic characterisation and the Fermi level in amorphous silicon
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Author keywords
Amorphous silicon; Diffusion length; Electronic properties; Photoconductivity
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Indexed keywords
DIFFUSION;
ELECTRON MOBILITY;
FERMI LEVEL;
HOLE MOBILITY;
HYDROGENATION;
NANOSTRUCTURED MATERIALS;
PHOTOCONDUCTIVITY;
SEMICONDUCTOR DOPING;
MICROCRYSTALLINE SILICON;
AMORPHOUS SILICON;
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EID: 0037416721
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(02)01227-0 Document Type: Conference Paper |
Times cited : (7)
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References (11)
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