Analysis and modelling of generation-recombination noise in amorphous semiconductors

Thin Solid Films

Volumn 427, Issue 1-2, 2003, Pages 133-136

  Badran, R I ^a   Main, C ^b   Reynolds, S ^b  

^a HASHEMITE UNIVERSITY   (Jordan)

^b UNIVERSITY OF ABERTAY DUNDEE   (United Kingdom)

Author keywords

Amorphous semiconductors; Computer simulation; Electrical noise

Indexed keywords

COMPUTER SIMULATION; EQUIVALENT CIRCUITS; PHOTOCONDUCTIVITY; SEMICONDUCTING FILMS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; THIN FILMS;

AMORPHOUS SEMICONDUCTORS;

AMORPHOUS MATERIALS;

EID: 0037416682     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01159-8     Document Type: Conference Paper

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