Retrieving modulation parameters from HRTEM images of modulated structures

Ultramicroscopy

Volumn 96, Issue 2, 2003, Pages 181-190

  Höche, Thomas ^a,b   Neumann, Wolfgang ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

^b LEIBNIZ INSTITUTE OF SURFACE ENGINEERING IOM   (Germany)

Author keywords

High resolution transmission electron microscopy (HRTEM)

Indexed keywords

DATA PROCESSING; IMAGE ANALYSIS; IMAGE RETRIEVAL; MOLECULAR STRUCTURE; PARAMETER ESTIMATION; TRANSMISSION ELECTRON MICROSCOPY;

IMAGE MATCHING;

HIGH RESOLUTION ELECTRON MICROSCOPY;

BARIUM DERIVATIVE;

ACCURACY; ARTICLE; CRYSTAL STRUCTURE; IMAGE PROCESSING; METHODOLOGY; PARAMETER; QUANTITATIVE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037411730     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00006-8     Document Type: Article

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