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Volumn 45, Issue 7, 2003, Pages 1439-1453

Differences between corrosion products formed on copper exposed in Tokyo in summer and winter

Author keywords

A. Copper; B. AES; B. XRD; C. Atmospheric corrosion

Indexed keywords

ATMOSPHERIC HUMIDITY; AUGER ELECTRON SPECTROSCOPY; CHLORINE; SULFUR; WEATHERING; X RAY DIFFRACTION ANALYSIS;

EID: 0037411275     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-938X(02)00245-7     Document Type: Article
Times cited : (45)

References (26)
  • 13
    • 0005925811 scopus 로고    scopus 로고
    • Corrosion and reliability of electronic materials and devices
    • R.B. Comizzoli, R.P. Frankenthal, J.D. Sinclair (Eds.), The Electrochemical Society, Pennington, NJ
    • M. Watanabe, N. Aoki, K. Ikeda, Corrosion and reliability of electronic materials and devices, in: R.B. Comizzoli, R.P. Frankenthal, J.D. Sinclair (Eds.), Proceedings, vol. 99-29, The Electrochemical Society, Pennington, NJ, 1999, pp. 75-85.
    • (1999) Proceedings , vol.29-99 , pp. 75-85
    • Watanabe, M.1    Aoki, N.2    Ikeda, K.3
  • 17
    • 85031205824 scopus 로고    scopus 로고
    • unpublished work
    • M. Watanabe, unpublished work.
    • Watanabe, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.