A method to determine long-range order parameters from electron diffraction intensities detected by a CCD camera

Ultramicroscopy

Volumn 96, Issue 1, 2003, Pages 105-116

  Kimoto, Takayoshi ^a   Takeda, Toshiyuki ^b   Shida, Shigenari ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c IWAKI MEISEI UNIVERSITY   (Japan)

Author keywords

Cu3Au alloy; Electron diffraction intensity; Long range order parameter; Specimen thickness

Indexed keywords

ABSORPTION; APPROXIMATION THEORY; CAMERAS; CHARGE COUPLED DEVICES; COMPUTER PROGRAMMING; COPPER ALLOYS; SUPERLATTICES; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

LONG-RANGE ORDER PARAMETERS;

ELECTRON DIFFRACTION;

ALLOY; COPPER; GOLD;

ARTICLE; CALCULATION; CAMERA; COMPUTER PROGRAM; ELECTRON DIFFRACTION; X RAY DIFFRACTION;

EID: 0037410903     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00403-5     Document Type: Article

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