Material identification by surface reflection analysis in combination with bundle adjustment technique

Pattern Recognition Letters

Volumn 24, Issue 9-10, 2003, Pages 1589-1598

  Orun, A B ^a   Alkis, A ^b  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b YILDIZ TECHNICAL UNIVERSITY   (Turkey)

Author keywords

Active vision; CCD camera; Classification; Photogrammetry; Surface texture identification

Indexed keywords

LASER APPLICATIONS; MICROSTRUCTURE; REFLECTION;

SURFACE REFLECTION ANALYSIS;

PATTERN RECOGNITION;

PHOTOGRAMMETRY;

EID: 0037410617     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(02)00398-7     Document Type: Article

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