Lowest angle solution versus low-index axis solution for misorientations

Scripta Materialia

Volumn 48, Issue 12, 2003, Pages 1587-1591

  Cross, Ian ^a   Randle, Valerie ^b  

^a Trostre Works ^*  (United Kingdom)

^b SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Electron backscatter diffraction; Grain boundary; Misorientation

Indexed keywords

CRYSTAL ORIENTATION; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; SILICA;

MISORIENTATION DISTRIBUTIONS;

STEEL;

EID: 0037410106     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(03)00160-X     Document Type: Article

References (6)

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2. Randle V., Engler O. Introduction to texture analysis: macrotexture, microtexture and orientation mapping. 2000;Taylor and Francis.
3. Hutchinson W.B., Ryde L., Bate P.S., Bacroix B. Scripta Mater. 35:1996;579.
4. Gourdet S., Jonas J.J., Montheillet F. J. Appl. Cryst. 31:1998;204.
5. Cross IJ. Texture development in high strength steels, EngD thesis; University of Wales Swansea; 2000.
6. Mackenzie J.K. Biometrika. 45:1958;229.