Characterisation of semiconducting V2O5-Bi2O3-TeO2 glasses through ultrasonic measurements

Journal of Non-Crystalline Solids

Volumn 320, Issue 1-3, 2003, Pages 195-209

  Rajendran, V ^a   Palanivelu, N ^a   Chaudhuri, B K ^b   Goswami, K ^c  

^a MEPCO SCHLENK ENGINEERING COLLEGE   (India)

^b DEPARTMENT OF MATERIALS SCIENCE   (India)

^c JADAVPUR UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

GLASS TRANSITION; POISSON RATIO; QUENCHING; SEMICONDUCTING TELLURIUM COMPOUNDS; ULTRASONIC MEASUREMENT;

DEBYE TEMPERATURE; RAPID QUENCHING;

SEMICONDUCTING GLASS;

EID: 0037409721     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(03)00018-8     Document Type: Article

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