Planar growth faults in double-layered or triple-layered (Ca,Sr)-ruthenate single crystals by the self-flux technique

Journal of Crystal Growth

Volumn 252, Issue 1-3, 2003, Pages 372-381

  Xin, Y ^a   Cao, G ^b   Crow, J E ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF KENTUCKY   (United States)

Author keywords

A1. Transmission electron microscopy; B1. Layered transition metal oxides; B1. Ruthenate

Indexed keywords

ANNEALING; CALCIUM COMPOUNDS; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; MULTILAYERS; NUCLEATION; POSITIVE IONS; TRANSMISSION ELECTRON MICROSCOPY;

BI-LAYERED COMPOUNDS;

SINGLE CRYSTALS;

EID: 0037401380     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)00841-8     Document Type: Article

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