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Volumn 39, Issue 7, 2003, Pages 661-677

Integrated design method for flip chip CSP with electrical, thermal and thermo-mechanical qualifications

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER PROGRAMMING; COMPUTER SOFTWARE; ELECTRIC POTENTIAL; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; GENETIC ALGORITHMS; HEAT RESISTANCE; MATHEMATICAL MODELS; OPTIMIZATION;

EID: 0037399882     PISSN: 0168874X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-874X(02)00133-6     Document Type: Article
Times cited : (12)

References (23)
  • 1
    • 0002546991 scopus 로고    scopus 로고
    • Comparing flip-chip and wire-bond interconnection technologies
    • ChipScaleReview.com
    • P. Elenius, L. Levine, Comparing flip-chip and wire-bond interconnection technologies. Chip Scale Review, ChipScaleReview.com, 2000, pp. 81-87.
    • (2000) Chip Scale Review , pp. 81-87
    • Elenius, P.1    Levine, L.2
  • 4
    • 0031638611 scopus 로고    scopus 로고
    • Effect of material and geometry parameters on the thermal-mechanical reliability of flip-chip assemblies
    • S. Michaelides, S.K. Sitaraman, Effect of material and geometry parameters on the thermal-mechanical reliability of flip-chip assemblies, InterSociety Conference on Thermal Phenomena, 1998, pp. 193-200.
    • (1998) InterSociety Conference on Thermal Phenomena , pp. 193-200
    • Michaelides, S.1    Sitaraman, S.K.2
  • 5
    • 0032163194 scopus 로고    scopus 로고
    • Process induced stresses of a flip-chip packaging by sequential processing modeling technique
    • Wang J., Qian Z., Liu S. Process induced stresses of a flip-chip packaging by sequential processing modeling technique. J. Electron. Packag. Trans. ASME. 120:1998;309-313.
    • (1998) J. Electron. Packag. Trans. ASME , vol.120 , pp. 309-313
    • Wang, J.1    Qian, Z.2    Liu, S.3
  • 6
  • 18
    • 0342298393 scopus 로고    scopus 로고
    • FEM modeling of FCOB assembly warpage and stresses due to underfill encapsulation and thermal cycling loading
    • H.L. Pang, Y.R. Chong, S.K. Sitaraman, FEM modeling of FCOB assembly warpage and stresses due to underfill encapsulation and thermal cycling loading, Adv. Electron. Packag. EEP-Vol. 26-1 (1999) 803-807.
    • (1999) Adv. Electron. Packag. EEP , vol.26 , Issue.1 , pp. 803-807
    • Pang, H.L.1    Chong, Y.R.2    Sitaraman, S.K.3
  • 19
    • 0345761131 scopus 로고    scopus 로고
    • Three-dimensional versus two-dimensional finite element modeling of flip-chip packages
    • Yao Q., Qu J. Three-dimensional versus two-dimensional finite element modeling of flip-chip packages. J. Electron. Packag. Trans. ASME. 121:1999;196-201.
    • (1999) J. Electron. Packag. Trans. ASME , vol.121 , pp. 196-201
    • Yao, Q.1    Qu, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.