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Volumn 250, Issue 3-4, 2003, Pages 405-408

Oriented growth of CdS nanoparticulate film with constant average particle size with thickness up to ̃ 1 μm

Author keywords

A1. Atomic force microscopy; A1. Reflectivity; A3. Langmuir Blodgett; A3. Thin film growth; B1. Nanoparticles; B2. Semiconducting II VI materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM GROWTH; LANGMUIR BLODGETT FILMS; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; SEMICONDUCTING CADMIUM COMPOUNDS; THIN FILMS;

EID: 0037399791     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)02410-7     Document Type: Conference Paper
Times cited : (9)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.