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Volumn 76, Issue 4, 2003, Pages 613-624

Injection technique for the study of solar cell test structures

Author keywords

Charge injection; I V characterization; Solar cell; Test structure

Indexed keywords

CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; DIFFERENTIAL EQUATIONS; PHOTOVOLTAIC CELLS; SPECTRUM ANALYSIS;

EID: 0037398877     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(02)00271-4     Document Type: Conference Paper
Times cited : (38)

References (19)
  • 1
    • 0013188933 scopus 로고
    • Viervag, Braunschweig
    • F. Stockman, in: Halbleiterprobleme, Vol. 6, Viervag, Braunschweig, 1961, p. 279.
    • (1961) Halbleiterprobleme , vol.6 , pp. 279
    • Stockman, F.1
  • 3
    • 0013186315 scopus 로고
    • Double injection in semiconductors
    • R.K. Willardson, A.C. Beer (Eds.) New York and London: Academic Press
    • Baron R., Mayer J.W. Double injection in semiconductors. Willardson R.K., Beer A.C. Semiconductors and Semimetals. Vol. 6:1970;201 Academic Press, New York and London.
    • (1970) Semiconductors and Semimetals , vol.6 , pp. 201
    • Baron, R.1    Mayer, J.W.2
  • 5
    • 0016036859 scopus 로고
    • Adetailed analysis of the metal-semiconductor contact
    • Pellegrini B. Adetailed analysis of the metal-semiconductor contact. Solid-State Electon. 17:1974;217-237.
    • (1974) Solid-State Electon. , vol.17 , pp. 217-237
    • Pellegrini, B.1
  • 14
    • 0013193351 scopus 로고    scopus 로고
    • USSR Patent # 4617198, 1989
    • P.S. Smertenko, et al., USSR Patent # 4617198, 1989.
    • Smertenko, P.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.