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Volumn 18, Issue 2, 2003, Pages 551-558

Electrical behavior of contaminated distribution insulators exposed to natural wetting

Author keywords

Arcing; Contaminated insulators; Leakage current

Indexed keywords

IMPURITIES; LEAKAGE CURRENTS; MOISTURE; WETTING;

EID: 0037396222     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2003.809682     Document Type: Article
Times cited : (31)

References (10)
  • 1
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    • Development of a remote insulator contamination monitoring system
    • Jan.
    • C. N. Richards and J. D. Renowden, "Development of a remote insulator contamination monitoring system," IEEE Trans. Power Delivery, vol. 12, pp. 389-397, Jan. 1997.
    • (1997) IEEE Trans. Power Delivery , vol.12 , pp. 389-397
    • Richards, C.N.1    Renowden, J.D.2
  • 2
    • 0242614320 scopus 로고    scopus 로고
    • Leakage resistance data acquisition system and several data for maintenance of transmission line porcelain insulators along coasts in wet snow
    • Seoul, Korea
    • N. Sugawara, K. Hokari, M. Hijikata, A. Saito, and K. Yamanouchi et al., "Leakage resistance data acquisition system and several data for maintenance of transmission line porcelain insulators along coasts in wet snow," in Proc. 5th Int. Conf. Properties Applicat. Dielectric Materials, Seoul, Korea, 1997, pp. 20-23.
    • (1997) Proc. 5th Int. Conf. Properties Applicat. Dielectric Materials , pp. 20-23
    • Sugawara, N.1    Hokari, K.2    Hijikata, M.3    Saito, A.4    Yamanouchi, K.5
  • 3
    • 0032187641 scopus 로고    scopus 로고
    • Development of a new apparatus for contamination measurement of overhead transmission line insulators
    • Oct.
    • K. Iwai, Y. Hase, E. Nakamura, and H. Katsukawa, "Development of a new apparatus for contamination measurement of overhead transmission line insulators," IEEE Trans. Power Delivery, vol. 13, pp. 1412-1417, Oct. 1998.
    • (1998) IEEE Trans. Power Delivery , vol.13 , pp. 1412-1417
    • Iwai, K.1    Hase, Y.2    Nakamura, E.3    Katsukawa, H.4
  • 4
    • 0242529681 scopus 로고    scopus 로고
    • Leakage current characteristics caused by contaminated distribution insulators
    • San Luis Obispo, CA, U.S., Oct.
    • C. S. Richards, C. L. Benner, K. L. Butler, and B. D. Russell, "Leakage current characteristics caused by contaminated distribution insulators," in Proc. 31st Annu. North Amer. Power Symp., San Luis Obispo, CA, U.S., Oct. 1999, pp. 484-489.
    • (1999) Proc. 31st Annu. North Amer. Power Symp. , pp. 484-489
    • Richards, C.S.1    Benner, C.L.2    Butler, K.L.3    Russell, B.D.4
  • 6
    • 0028462056 scopus 로고
    • Accurate measurement of low insulator contamination levels
    • July
    • W. A. Chisholm, P. G. Buchan, and T. Jary, "Accurate measurement of low insulator contamination levels," IEEE Trans. Power Delivery, vol. 9, pp. 1552-1557, July 1994.
    • (1994) IEEE Trans. Power Delivery , vol.9 , pp. 1552-1557
    • Chisholm, W.A.1    Buchan, P.G.2    Jary, T.3
  • 10
    • 0029291224 scopus 로고
    • Arcing fault detection for distribution feeders: Security assessment in long term field trials
    • Apr.
    • B. D. Russell and C. L. Benner, "Arcing fault detection for distribution feeders: security assessment in long term field trials," IEEE Trans. Power Delivery, vol. 10, pp. 676-683, Apr. 1995.
    • (1995) IEEE Trans. Power Delivery , vol.10 , pp. 676-683
    • Russell, B.D.1    Benner, C.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.