Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe deposited on glass substrates

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 17, Issue 1-4, 2003, Pages 552-553

  Johann, L ^a   Ennaciri, A ^a   Broch, L ^a   Demange, V ^b   Machizaud, F ^b   Dubois, J M ^b  

^a Lab Phys Liquides et Interfaces   (France)

^b UNIVERSITÉ DE LORRAINE   (France)

Author keywords

Al Cr Fe; Ellipsometry; Optical constants; Transmission

Indexed keywords

ALUMINUM; ELLIPSOMETRY; GLASS; OPTICAL PROPERTIES; SPECTROSCOPIC ANALYSIS; SUBSTRATES; SURFACE PHENOMENA; TRANSMISSION ELECTRON MICROSCOPY;

OPTICAL CONSTANTS;

THIN FILMS;

EID: 0037395045     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(02)00867-6     Document Type: Conference Paper

References (2)

1. Demange V., Anderegg J.W., Ghanbaja J., Machizaud F., Sordelet D.J., Besser M., Thiel P.A., Dubois J.M. Appl. Sur. Sci. 173:2001;327.
2. Demange V., Milandri A., de Weerd M.C., Machizaud F., Jeandel G., Dubois J.M. Phys. Rev. B. 65:2002;144205.