The plasmon resonance absorption of Ag/SiO2 nanocomposite films

Microelectronic Engineering

Volumn 66, Issue 1-4, 2003, Pages 192-198

  Yang, Lin ^a   Liu, Yuliang ^a   Wang, Qiming ^a   Shi, Huazhong ^b   Li, Guanghai ^b   Zhang, Lide ^b  

^a INSTITUTE OF SEMICONDUCTORS   (China)

^b INSTITUTE OF SOLID STATE PHYSICS   (China)

Author keywords

Ag SiO2 nanocomposite film; Mie theory; Plasmon resonance absorption; Quantum size effect; Surface resonance state

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRODYNAMICS; ELECTRONIC STRUCTURE; LIGHT ABSORPTION; NANOSTRUCTURED MATERIALS; SILICA; SURFACE PLASMON RESONANCE; THIN FILMS;

PLASMON RESONANCE ABSORPTION;

ALUMINUM;

EID: 0037393498     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(03)00046-7     Document Type: Conference Paper

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