An intensity evaluation method: EVAL-14

Journal of Applied Crystallography

Volumn 36, Issue 2, 2003, Pages 220-229

  Duisenberg, Albert J M ^a   Kroon Batenburg, Loes M J ^a   Schreurs, Antoine M M ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATION; ANALYTIC METHOD; ANISOTROPY; ARTICLE; CRYSTAL; CRYSTAL STRUCTURE; DEVICE; DIFFRACTION; EVALUATION; INSTRUMENT; REFLECTION INTENSITY INTEGRATION METHOD;

EID: 0037393379     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889802022628     Document Type: Article

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