Analysis of the turn-off failure mechanism of silicon power diode

Solid-State Electronics

Volumn 47, Issue 4, 2003, Pages 727-739

  Huang, Alex Q ^a   Temple, Victor ^a,b   Liu, Yin ^a,c   Li, Yuanzhu ^a,d  

^a State University   (United States)

^b Silicon Power Corporation   (United States)

^c Chrontel Inc   (United States)

^d RF Integrated Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; FAILURE ANALYSIS; ISOTHERMS;

POWER DENSITY;

AVALANCHE DIODES;

EID: 0037392560     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00328-3     Document Type: Article

References (9)

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