Effect of tunneling frequency on relaxor behavior

Microelectronic Engineering

Volumn 66, Issue 1-4, 2003, Pages 676-682

  Wu, Zhongqing ^a   Duan, Wenhui ^a   Liu, Zhirong ^a   Gu, Bing Lin ^a   Zhang, Xiao Wen ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Ferroelectric; Relaxors; Tunneling frequency

Indexed keywords

DIFFUSION; FREQUENCIES; PHASE TRANSITIONS; THERMAL EFFECTS;

TUNNELING FREQUENCY;

FERROELECTRIC MATERIALS;

EID: 0037391733     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(02)00982-6     Document Type: Conference Paper

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