Finding defining generators with extreme lengths

Journal of Statistical Planning and Inference

Volumn 113, Issue 1, 2003, Pages 315-321

  Cheng, Shao Wei ^a   Wu, C F J ^b   Wu, Huaiqing ^c  

^a INSTITUTE OF STATISTICAL SCIENCE   (Taiwan)

^b UNIVERSITY OF MICHIGAN   (United States)

^c Department of Statistics Center for Statistics and Applications in Forensic Evidence Iowa State University 2438 Osborn Dr Ames   (United States)

Author keywords

Blocked fractional factorial design; Defining contrast subgroup; Minimum aberration; Split plot design

Indexed keywords

EID: 0037387506     PISSN: 03783758     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-3758(01)00309-3     Document Type: Article

References (8)

1. Cheng, C.S., 1985. Run orders of factorial designs. In: Le Cam, L.M., Olshen, R.A. (Eds.), Proceedings of the Berkeley Conference in Honor of Jerzy Neyman and Jack Kiefer, Vol. 2, Wadsworth, Belmont, CA, pp. 619-633.
2. Cheng, C.S., Steinberg, D.M., 1991. Trend robust two-level factorial designs. Biometrika 78, 325-336.
3. k-p designs. Technometrics 22, 601-608.
4. Huang, P., Chen, D., Voelkel, J.O., 1998. Minimum-aberration two-level split-plot designs. Technometrics 40, 314-326.
5. n-k designs. Technometrics 39, 382-390.
6. n-p designs. Technometrics 39, 298-307.
7. Wu, C.F.J., Hamada, M., 2000. Experiments: Planning, Analysis, and Parameter Design Optimization. Wiley, New York.
8. Wu, C.F.J., Zhang, R., 1993. Minimum aberration designs with two-level and four-level factors. Biometrika 80, 203-209.