A simple four-terminal small-signal model of RF MOSFETs and its parameter extraction

Microelectronics Reliability

Volumn 43, Issue 4, 2003, Pages 601-609

  Je, Minkyu ^a   Han, Jeonghu ^a   Shin, Hyungcheol ^a   Lee, Kwyro ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COUPLED CIRCUITS; ELECTRIC CURRENTS; GATES (TRANSISTOR); PARAMETER ESTIMATION;

PARAMETER EXTRACTION;

MOSFET DEVICES;

EID: 0037382827     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00352-9     Document Type: Article

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